Integrated In-Circuit and Functional Test in One System Lower Overall Test System Cost
Auto-link to all software and hardware
PXI hardware modules
Support RS232 bus and interface
Wide selection of PXI and GPIB hardware options
Share PC, Fixture, and power supplies for all tests
Easy to Use On Board Programming Software Modularized memory algorithms provide convenient On Board Programming solutions
Flash Programming
Serial Device Programming
Powerful Boundary-Scan Test Capability Auto-Generation of test program and reporting through
Boundary-Scan Test Program Generator (BSTG) for
different kinds of test categories, such as individual
boundary-scan device test, boundary-scan device
chain test, and virtual nail test for RAM, ROM, TTL,
and TREE devices
The Most Cost-Effective Test Strategy Non-Multiplexing Pin Design, Driver/Receiver Ratio 1:1
Optimized all placement with 1:1 ratio flexibility
Moving, existing wires not required for ECNs in your fixture
1:1 driver/receiver pins provided, for fastest test program development and debugging
TR-5001 ICT and TR-7100 AOI Auto-Link Software
Auto-link TR-5001 ICT and TR-7100 AOI to get the best test strategy
