Qualectron - TR-8001

Powerful Software Environment

Microsoft Windows-compatible system software,
friendly user-interface design
ATPG automatic digital program generation
Auto-learning and automatic program
generation for testing open/short, pin Information
Clamping diode, TestJet technology,
automatic guarding points selection
Built-in system self-diagnostic function
Paperless repair system, real-time process
monitoring & paperless repair station
Practical quality management and statistic
reports available
"BoardView" function can locate defective devices
and pins instantly

Advanced Testing Technology Integration
In-Circuit digital testing with non-multiplexing
driver/receiver
High fault coverage for analog, digital,
mixed-signal, and memory testing
The best BGA testing solution with "BoundaryScan" & NAND Tree
On-board programming of Flash & EEPROM memories
TestJet technology, the best solution to examine most SMT IC lead soldering defects
IC clamping diode test technologies can enhance the testing coverage of BGA package
Alternative learning module can automatically generate IC reverse check program
Test modules include: frequency measurement, voltage measurement
and Current measurement
Pin-contact check capability
Multiple safety protection design for press type

Conversion Toolkit
Protect investment in fixtures and test programs
Improve throughput
Increase test coverage
Upgrade test capabilities
Save time and money
Changing ATE venders is no longer difficult
High accuracy wireless-convertion adapter
TRI provides three converting options:
a. Agilent to TRI adapter
b. GenRad to TRI adapter
c. Teradyne to TRI adapter
Intelligent converting software, convert and improve
the testing capabilities